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Reliability Society Newsletter
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Vol. 58, No. 2. May 2012 |
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President's Message
Reliability Society Members, As you are well aware, the Reliability Society (RS) is a technical Society within the IEEE, the world's leading association for the advancement of technology. The RS is a volunteer group of professionals engaged in assuring reliability in the engineering disciplines of hardware, software, and human factors. The RS is focused on the broad aspects of reliability and trustworthiness, allowing the RS to be seen as the IEEE Specialty Engineering organization. The RS drives the abilities for attaining and sustaining these broad reliability-oriented design attributes across the product's total life cycle. The RS has the management, resources, and administrative and technical structures to develop and to provide technical information via publications, training, conferences, and technical library (IEEE Xplore) data. The Reliability Society has 23 Chapters and has members in 60 countries worldwide. Thanks to Zhaojun (Steven) Li for becoming the Chicago RS Chapter Chair and reactivating the Chicago RS Chapter. Steven Li has a PhD, has done research in Reliability and Physics-of-Failure Analysis, and is a Reliability Engineer at Electro-Motive Diesel, a subsidiary of Progress Rail and Caterpillar. Their first 2012 RS Chapter meeting was held on April 13 at the Engineering Research Facility (ERF) at the University of Illinois at Chicago with good attendance. Their meeting agenda consisted of a pre-meeting social, Introduction to the RS Chapter, Diagnostic and Prognostics Presentation, and then an after meeting social. Ref their website (http://ieeechicago.org/Default.aspx?alias=ieeechicago.org/rs) Thanks to Professor Eric Wong for holding and involving us with the UTD Computer Science Colloquium / IEEE RS Student-Industry Outreach, held on May 4. The topic was "RanTGen: A Tool for Random Generation of Valid Object Configurations for Testing Object-Oriented Programs" presented by Sudipto Ghosh, an Associate Professor in the Department of Computer Science at Colorado State University. Thanks to Sudipto Ghosh for his nice presentation. His presentation Abstract: Developing effective test cases for large-scale object-oriented software is challenging. In spite of decades of research on software testing, industrial-strength test generation approaches are hard to find. A scalable approach to test input generation is required to support systematic software testing on a large scale and at various levels (unit, integration, and system). While random test generation approaches can be fast and scalable, they are generally not as effective as systematic test generation approaches, which achieve higher code coverage. We present a scalable and effective test generation approach for object-oriented programs. This approach leverages aspects of both random and systematic test generation approaches. The approach uses guided random generation of valid test inputs that cover diverse object configurations. Given a program-under-test and a structural design specification, the approach produces object configurations that conform to the design specification. A specification is a class model that includes, for example, multiplicity constraints on associations. The test cases are generated in the form of JUnit tests, which are widely used in the software industry.
The RS will be holding the following annual conferences this summer:
Best regards,
Dennis Hoffman |
From the
Editor
In this 2012 May issue of Reliability Society Newsletter, President Dennis Hoffman begins with a brief introduction to Reliability Society (RS). In this introduction, Dennis highlights the disciplines and the achievements of RS. Furthermore, he briefly described the RS resources that are available to the newsletter readers. We also would like to take this opportunity to thank Zhaojun (Steven) Li for becoming the Chicago RS Chapter Chair and the volunteer officers in Chicago RS Chapter for their dedication to RS. It is wonderful to have the Chicago RS Chapter re-activated. This issue also would like to call for participation in SERE2012, and call for submissions to two T-Rel special sections on "Battery Reliability and Safety" and "Information, System, and Software Assurance: Research & Practice", respectively. This issue contains "Condition Based Management Augmenting Software and System Reliability" by Dr. Samuel J Keene of FIEEE. In this article, Dr. Samuel J Keene uses Prof. Jeffery Voas's pictorial representation of "nesting and interaction of software and system components" to explain the relationships of software and system on reliability issues. The article further explains that the source of a software failure may be the system that the software runs on, and introduces the concept of "software rejuvenation" to enhance overall reliability. The 2nd article "Human Reliability" by Dr. Irving Engelson of LFIEEE highlights a problem that we all take for granted in our daily life. The problem involves with expectation of a human being, and this expectation helps us to judges the reliability of a human being. Thus, this leads to Dr. Irving's topic, "Human Reliability", where he is requesting general comments on the proposed topic. The Newsletter has been the society's primary media for sharing thoughts on reliability related issues and announcements of events of interest to our members. This newsletter will publish content deemed appropriate for and of interest to members of the IEEE Reliability Society and members of the reliability profession in general. Accepted content includes announcements and reports of activities sponsored by the Reliability Society including chapter meetings, workshops and conferences. Technical papers including reviews, opinions, case studies or new ideas for the reliability professional are welcomed and accepted without external review. Authors are solely responsible for the correctness of results presented and proper citation of work by others. For submissions to Prognostic Health Management (PHM) section, please contact Dr. Pradeep Lall who is the editor handling the PHM section. For further information please contact Dr. Lall. I would like to thank the RS Officers, AdCom members, Chapter chairs and members at large who have contributed to this issue. I sincerely hope our members can continue sharing your thoughts through our newsletter. If you have any suggestions or comments on the newsletter, please feel free to contact me at your convenience. Shiuhpyng Winston Shieh, PhD The content is this publication is protected by all applicable copyright laws. Links to this website from commercial websites is permitted and encouraged, however, content may not be copied without use of proper citation. (c) 2011 IEEE Reliability Society |
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