IEEE Reliability Society Newsletter     Vol. 61, No. 4, November 2015

Table of Contents

Front page:

President's Message

From the Editor


Society Events and Announcements:

2016 QRS Conference, Vienna, Austria - Call for Papers

2016 PHM Conference, Ottowa, Canada - Call for Papers

Announcing 2016 System of Systems Engineering (SoSE), Kongsburg, Norway

RS Tutorial in Beijing, China

2015 PHM Conference, Austin - Revisited

RS Outreach in Nanjing, China

RS Outreach in Wuhan, China


Members & Chapters:

Boston Chapter Summary

Dallas Chapter


Letters in Reliability:

More Reliable Decision Making - Sam Keene


Links:

Reliability Society Home

RS Newsletter Homepage

Dallas Chapter Report

Fall 2015 IEEE Reliability Society Student Outreach
at the University of Texas at Dallas

W. Eric Wong
Vice President for Publications
Chair, Dallas Chapter

Lon Chase
Member of Administrative Committee
Vice Chair, Dallas Chapter

The RS Dallas Chapter collaborated with the Department of Computer Science at the University of Texas at Dallas and the IEEE Dallas Section to organize at least one outreach event each semester for students in Computer Science and Software Engineering since 2010.

The event for Fall 2015 was held on September 25th with Dr. Dimitris Simos from SBA Research, Austria as the speaker. The focus of his lecture was on “Combinatorial Security Testing: Improving Information Security through Combinatorial Testing” with the abstract listed below.

Over the recent years, a number of combinatorial strategies have been developed to help testers choose subsets of input combinations that would maximize the probability of detecting faults with combinatorial testing as the most prominent one. Such testing has been successfully applied for testing (critical) software systems in large organizations and is an already proven method for security testing of large-scale software systems.

The emphasis of the talk is on presenting the advances on web application security testing, testing of operating systems, and applying combinatorial testing to information security.

Before the lecture, Dennis Hoffman, the Jr. Past President of the IEEE Reliability Society, gave his welcome remarks and explained the benefits of being a RS member. The following pictures were taken during the outreach.


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From left to right: Ron Knerr (Texas Instruments), Eric Wong (UT-Dallas), Dimitris Simos (SBA Research), and Dennis Hoffman (Lockheed Martin Aeronautics Company)
 

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