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Reliability Society Distinguished Lecturers

Reliability Society Distinguished Lecturers
Topics and Speakers

The Reliability Society is pleased to offer the following lectures.  Each of our lecturers is a recognized expert in their area.  To review an abstract for a topic, click on the topic title.  To arrange for a speaker, please contact Sam Keene, our Distinguished Lecturers Coordinator.

Focused Ion Beam Technology: Applications in Microelectronics               
Marsha Abramo

Design and Management of Reliable Software Intensive Systems
Larry Bernstein

Accelerated Stress Testing
Anthony Chan 

Mechanical Reliability    
Dick Doyle

Thermal Analysis
Dick Doyle

Medical Electronics
Dick Doyle

Reliability methods applied to Nano-Materials and Technologies
Carole Graas

Repairable Systems Reliability -- Modeling and Failure Data Analysis
Christian Hansen

Development Process Software Prediction Reliability Model
SamKeene

Developing World Class Requirements Through DFSS Tools and Processes
Sam Keene

Six Sigma Tools to Help You Do Your Job
Sam Keene

Data Collection and Analysis using the Minitab Tool
Sam Keene

Green Belt Six Sigma Certification - 80 hours
Sam Keene

Accelerated Life Testing - ESS, HALT/HASS, Time Stress Tests; Models, Applications, Examples
James McLinn

Assessment of the Trustworthiness and Dependability of Cloud Services             
Bret Micheal

Improving Software FMEA Processes and Results
Nat Ozarin

New Tools and Techniques for FMEA of System Interconnection Designs
Nat Ozarin

A Powerless Cloud
William Tonti

Technology On the Edge
William Tonti

Chip Reliability
William Tonti

eFuse Design and Reliability 
William Tonti

Obtaining a US Patent
William Tonti

Software Fault Injection and its Relationship to Software Testing
Jeffrey Voas

Smartphones (Android) in Foreign Wars: Security Challenges and Opportunities
Jeffrey Voas

Last Updated on 29 July 2011