Distinguished Lecture Material
This page contains Reliability Society Distinguished Lecture material that has been presented as part of the society's DL program.
Covariate Software Reliability Models and Applications
Distinguished Lecturer, Lance Fiondella
Presented December 8, 2020
Abstract: Traditional software reliability growth models enable quantitative assessment of the software testing process by characterizing defect detection in terms of testing time or effort. However, the majority of these parametric models do not identify specific testing activities underlying defect discovery and thus can only provide general guidance on how to incrementally allocate effort. This talk presents a non-homogeneous Poisson process software reliability growth model incorporating covariates based on the discrete Cox proportional hazards model, which explicitly links test activities to defect discovery. Efficient and stable expectation conditional maximization algorithms are derived to estimate the numerical parameters of a model that best characterize the failure data collected during testing. An optimal test activity allocation problem is formulated to maximize defects discovered, so that they can be corrected prior to release. An overview of the Covariate Software Failure and Reliability Assessment Tool (C-SFRAT) will also be provided.
Lecturer Bio: Lance is an associate professor in the Department of Electrical & Computer Engineering at the University of Massachusetts Dartmouth. He received his PhD (2012) in Computer Science & Engineering from the University of Connecticut. Dr. Fiondella has published over 130 peer-reviewed journal articles and conference papers, twelve of which have been recognized with awards, including seven with his students. His research has been funded by the United States Department of Homeland Security, U.S. Army Research Laboratory, Naval Air Systems Command, Naval Sea Systems Command, National Aeronautics and Space Administration, and National Science Foundation, including a CAREER award.
Why Blockchain and Reliability
Distinguished Lecturer, Jason Rupe
Presented August 28, 2020
Abstract: Distributed ledger technologies (DLT) like blockchain are complex systems, often at large network scale, but simple to understand. In the context of reliability, they deserve the attention of reliability experts because of their value toward systems and information reliability, and because of their security and reliability vulnerabilities. In this talk, we will review and discuss DLT and the reliability concerns within and around it.
Lecturer Bio: Jason got his Ph.D. modeling large scale systems and networks for performance and reliability. He has held titles including senior technical staff and director at USWEST, Qwest, Polar Star Consulting, and Tenica. He was the Managing Editor for the IEEE Transactions on Reliability and has several IEEE roles currently including Denver Section Chair, VP Conferences for Reliability Society, and co-chair of IEEE Blockchain initiative. He is the Principal Architect for Proactive Network Maintenance at CableLabs.
Sponsored by The Reliability Society
Co sponsored by Denver Section, Denver Blockchain Local Group, and Blockchain Initiative