IEEE Reliability Society Newsletter     Vol. 56, No. 1. February 2010

Table of Content

Front page:
President's Message
From the Editor

Society News:
Meet the RS officers and
AdCom Class of 2012

RS Members Receive Fellows Recognition

Reliability Engineers Recognized at the Annual RS Banquet.

Distinguished Lecturer Program:
Call for RS
Distinguished Lecturers

Feature Article:
NXT Battery Voltage Experiment

Chapter Activities:
Cleveland Chapter

Dallas Chapter
Singapore Chapter

Technical Activities:
Annual Technology Report

New Smart Grid Technology Initiative

Security and Privacy Magazine: Call for Papers


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Chapter Activities:

Singapore Chapter

Update by Alistair David Trigg, Chapter Chair


In January the chapter hosted a technical talk by Professor Young Chang Joo of Seoul National University, Korea on "Effect of Pulse DC and AC on the Reliability of Dielectric Breakdown in Damascene Cu and Solder Bump" on 20 January 2010 at Nanyang Technological University.

Planning is well underway for the 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - IPFA 2010  which will be held in Singapore from 5 to 9 July this year. The deadline for abstracts is passed but there is still time to register to attend the conference, to submit a photo to the Photo Contest, "Art of Failure Analysis", or to book an exhibition booth. See the web page for more details: