IEEE Reliability Society Newsletter Vol. 56, No. 1. February 2010
Table of Content
Distinguished Lecturer Program:
Update by Alistair David Trigg, Chapter Chair
In January the chapter hosted a technical talk by Professor Young Chang Joo of Seoul National University, Korea on "Effect of Pulse DC and AC on the Reliability of Dielectric Breakdown in Damascene Cu and Solder Bump" on 20 January 2010 at Nanyang Technological University.
Planning is well underway for the 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - IPFA 2010 which will be held in Singapore from 5 to 9 July this year. The deadline for abstracts is passed but there is still time to register to attend the conference, to submit a photo to the Photo Contest, "Art of Failure Analysis", or to book an exhibition booth. See the web page for more details: http://ewh.ieee.org/reg/10/ipfa/index.htm