The IEEE Reliability Joint Section Chapter (Boston
- New Hampshire - Providence) has held several meetings since
our last newsletter entry. The AdCom is currently reviewing the potential
speakers & meetings for the up-coming 2010-2011 meeting season, including
Reliability track support for the 58th NEQC Conference!
March 2009: Michael Benedek Sr. Principal Engineer &
Reliability team lead from Raytheon RF Components presented "Microwave Device Reliability
Characterization-The Mechanics of Life Test Execution and Analysis". This
meeting was held on Tuesday March 10 at Teradyne Inc. North Reading, MA campus
with a total of 36 members and guests.
April 2009: on Wednesday the 15th we held
our meeting at EMC Corporation Headquarters in
IEEE Fellow, Dr. Shubu Mukherjee who is a Principal Engineer at Intel
Corporation presented “Super-Linear
Increase in Soft Error Rate from Doubling the Cache Size: Bug or Phenomenon?”
Dr. Mukherjee reviewed detectable
unrecoverable errors experienced in the expansion of processor L2 Cache with 31
members and guests.
May 2009: Romano
Annecchiarico, Operations Reliability Lead from Teradyne, Inc. presented
“Effective Environmental Test
Technology in New Product Introduction (NPI)”. This
meeting was held on Wednesday May 13 at RSA, the Security Division of EMC, Bedford, MA
with 43 members and guests.
The June 09 meeting at Teradyne N.
Reading, (right image) David Casper, IEEE
RI Section Chair, Ramon De la Cruz, IEEE Reliability
Society Joint Section Chapter Chair, Eddie Robins, Secretary, Aaron
Dermarderosian, vice chair and Jim Anderson, IEEE New Hampshire Section Chair.
June 2009: on Tuesday the 16th we held our meeting at Teradyne Inc. North
Reading, MA campus. Donald V. Trenholm
founder and CEO of Custom Analytical Services,
Salem, NH presented
“Effective Techniques for the
Identification of Counterfeit Electronics”. Don’s presentation included
typical examples of the creative methods used by device counterfeiters and gave an overview of methods for spotting suspect
parts to 45 members and guests which included the
and New Hampshire Section Chairs.
July 2009: On Tuesday the 14th the IEEE Reliability
Society Joint Section Chapter held a joint meeting with the SMTA which included
a tour of Benchmark Electronics, Hudson,
NH Product Assurance and Failure
Analysis Laboratory and technical presentations by experts from U-Mass Lowell,
Benchmark and EMC Corporation.
- Greg Morose, New England Lead Free
Electronics Consortium, University of Massachusetts
Lowell presented “Long Term Reliability Analysis of
Lead Free and Halogen Free Electronic Assemblies”.
- Deb Fragoza, EMC Corporation,
Hopkinton MA, Bob Farrell and Paul Bodmer, Benchmark Electronics, Hudson NH
presented “Evaluation of a RoHS
Compliant Nanotechnology Printed Circuit Board Surface Finish”.
Bob Farrell, Benchmark Electronics, Hudson NH, hosted a live demonstration of a
Pb-free through-hole rework technique used in Phase IV to minimize copper dissolution.
The 64 members and guests who attended this event were treated to a
summer BBQ Dinner.
Meetings & Events: (Sept ‘09 - Apr ‘10)
September 2009: our first meeting of the ‘09-‘10 season
was held on Wednesday, Sept 9 at RSA, the Security Division of EMC, Bedford,
MA. Frank Andres, Senior Customer
Technical Support Engineer for Alpha Metals Inc/Cookson Electronics presented
“SMT and Wave Soldering Technology
Drivers and Their Influence on Alloy Selection“ to 30 members and
October 2009: the IEEE Reliability Society Joint Section Chapter
held a joint meeting with the Northeast
Chapter of the ESD Association at RSA, the Security Division of EMC, Bedford, MA
on Wednesday, October 14. Ted Dangelmayer, President and CEO, Dangelmayer
Associates presented “Common ESD Myths and Pitfalls of ESD
Measurement Instruments” to 45 members and guests.
November 2009: Philip Scarf, Member of the Technical Staff, Alcatel-Lucent
presented “A New Approach to System-Availability Analysis: An
Integrated Hardware, Software, and Procedures Model” at our meeting held on Wednesday November 11 at RSA,
the Security Division of EMC, Bedford,
MA. 35 members and guests attended this
December 2009: On December
9 we held our annual chapter past chairs & dinner meeting at RSA, the Security Division
of EMC, Bedford,
MA. A chapter brief was presented highlighting
chapter meetings & activities through 2009 and the results of our annual Chapter
For the 2010 term Ramon De la Cruz
(Teradyne) was re-elected as chapter Chair, Aaron DerMarderosian Jr. (Raytheon)
re-elected as chapter vice-chair, Don Markuson (Sierra Atlantic) was re-elected
as chapter Treasurer & Shivarajiv Somisetty (M/A-COM) was elected to chapter
Secretary. For our annual dinner meeting, we had several past chapter chairs in
attendance. Amongst those recognized for their contributions were:
Hevesh: Chair 1969-1970
Simpson: Chair, 1973 – 1974 & 1989 - 1990
Markuson: Chair, 1990 - 1991 & 1995 – 1996
McQuillan: Chair, 1994 – 1995
Kedem: Chair, 1997 - 1999
Fahy: Chair, 1999 - 2000 & 2004
Clark: Chair, 2000 - 2003 & 2005
DerMarderosian Jr.: Chair, 2006 – 2008
De la Cruz: Chair, 2009
Our featured guest speakers: Giora Kedem, Reliability Consultant, Daniel Wilder, Consultant, Hardware Engineer and Carl Nickerson, Software
Engineer, all from RSA,
the Security Division of EMC, Bedford, MA, presented “100X Token Reliability Improvement“, where they described the best practices used by their
reliability group to improve the reliability of some of RSA’s most
popular products. We had a total of 31
members & guests at this meeting.
January 2010: we held our first meeting of 2010 on Wednesday, January
13 at Teradyne Inc. North Reading, MA. Dave Dwyer, BAE Systems presented "Improvements
in Automated Reliability Growth Plotting and Estimations“ to 45 members and guests.
February 2010: our meeting scheduled for
February10 was canceled, due to winter weather.
March 2010: Don Restiano and Liz Markewicz, Raytheon
Company presented “Risk Management: Pro-active Principles for Project
Success” on Wednesday, March 10 at RSA, the Security Division
of EMC, Bedford,
MA. 39 members and guests attended this
April 2010: on Wednesday, April 14 we held our meeting at RSA,
the Security Division of EMC, Bedford,
MA. Prof. David I. Heimann, Reliability Engineer, presented “A
Bipartite Empirically Oriented Metrics Process for Agile Software Development”
to 22 members and guests.
Upcoming meetings & Events:
May 2010: Keith Donaldson, Engineered Materials Inc. presentation:
“How carbon footprints, green
initiatives and reliability work together, or against each other?“,
scheduled for May 12 at RSA, the
Security Division of EMC, Bedford,
In June 2010,
IEEE Reliability Society Standards Committee
Chair, Lou Gullo, Raytheon – Integrated
Defense Systems (IDC) Seapower
Capability Center (SCC) in Portsmouth,
RI, will present “IEEE
Reliability Society Standards Status and Descriptions”. This meeting
will be held June 9 at EMC Corporation Headquarters in
Registration for this event is open on the Boston Reliability chapter website
and will close on Friday, June 4, 2010.
In October 2010, The Joint section chapter will support the
Reliability Track for the 58th
NEQC Conference. This will be the 3rd
consecutive conference where the Reliability chapter has chaired the track at
this biannual event.
check our website periodically for updates on upcoming events!
you would like to present a reliability based topic at a future meeting, have meeting
topic suggestions or ideas about how to improve our meetings, we want to hear
from you! Please send an e-mail to any of the AdCom members or go to our
website and Click on:
Suggest a Meeting Topic.
To participate or
provide input to chapter technology development activities, sign up to become a
committee participant using our website.
Click here to participate in Technology Development.
You can also be added to the
chapter e-notice distribution via our website, click on:
to E-Notices or send a request to:
email@example.com (Vice-chair, notices & registration).
Ramon De la Cruz. - Chair,
Reliability Joint Section Chapter
(Boston - New Hampshire -