IEEE Reliability Society Newsletter     Vol. 56, No. 2. May 2010

Table of Content

Front page:
President's Message

From the Editor

Society News:
Stay Connected With Your Reliability Society: Facebook, Yahoo Groups and LinkIn

AdCom Elections: Call for Nominations

Awards: Call for Nominations

Feature Article:
Security and Fault Tolerance-
a Cmap

Chapter Activities:
Dallas Chapter

Joint Boston, New Hampshire, Providence Chapter

Denver Chapter

Cleveland Chapter

Technical Activities:
Annual Technology Report

Prognostic Health Management Conference -
Announcement and Call for Papers

IEEE SmartGrid Conference
Call for Papers

Green Technology Reliability Seminar

Safety & Reliability Workshop

Maxim Resource Library

Security and Privacy Magazine: Call for Papers

Distinguished Lecturer Program:

Call for RS
Distinguished Lecturers

Reliability Society Home

RS Newsletter Homepage

Chapter Activities:

Dallas Chapter
Faye Bilger Chair


Annual Chapter Award

Milton Tam was presented the Reliability Society Dallas Chapter annual achievement award at the Dallas Section Awards Banquet on Saturday April 24th, 2010.  Milton has provided outstanding service to the Dallas Chapter as the Program Chair.  Over the past several years, Milton has organized numerous chapter meeting speaker presentations to provide a significant benefit to many local members and others.  His dedicated service was recognized in this award.

Technical Meeting

Co-Sponsored By - EDFAS Lone Star Chapter and Dallas IEEE Reliability Society

Presenter:  Mr. Roger Stierman
Advanced Gas Injection to Turbocharge your FIB/SEM Applications

Date:    Wednesday, April 28, 2010
Location: Plano Texas


Many owners of focused ion beam (FIB) and scanning electron microscopes (SEM) are using pattern generators on their systems for direct beam writing from  beam-gas interactions.  With the wide variety of applications, from the building of nanoscale structures to TEM lift-out sample preparation, the optimization of beam & gas variables is an important and complex task.  Recent technological improvements have resulted in gas injection hardware that maximizes operator control and flexibility on the FIB or SEM hardware.  Comparisons will be presented on deposition rates with various precursors, changes in gas delivery amounts, and other factors impacting the beam-gas interaction process to fabricate the materials for research, development, and process control monitoring.