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Table of
Content
Front
page:
President's
Message
From the Editor
Messages from VPs:
VP Publications Report from Dr. Robert Loomis
Society
News:
2011 EXCOM and ADCOM Members
Prestigious Engineer of the Year Award
Best Chapter Awards
AdCom Meeting
Nominations for IEEE Medals and Recognitions
RS seeks Administrative Committee Candidates for 2012/2013/2014 Term
Reliability Society Past AdCom Members Obituaries:
Former RS President Monshaw Dies At 84
Obituary for Ann Miller
Feature Articles:
Reliability through the
Ages
Reliability Overview of Air Traffic Reliability in the National Air Space
Regular Articles:
Field Based Reliability Calculations (MTBF) – Surmounting Practical Challenges. An outside the box approach.
Applying basic and familiar reliability theory to estimating and improving the avialablity of software-intensive systems
Fault Tolerance in Web Services
PHM Articles:
Detection of Multiple Failure-Modes in Electronics using Self-Organized Mapping
Book Review :
Reliability Engineering Book Review
Chapter Activities:
Cleveland Chapter
Taipei/Tainan Chapter
The Denver Chapter awarded a certificate to Hobbs Engineering
Announcements:
Solicitation for Society Technical Committees
UK&RI Workshop on Reliability and Safety
WCEAM-IMS 2001
Links:
Reliability Society Home
RS
Newsletter Homepage
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VP Publications ReportDr. Robert Loomis
There is a lot of Pubs information to share with you in this report. Highlights of what is happening in the Publications area include:
New Publication — The RS has agreed to partner with the Electron Device Society and other societies to co-sponsor the Journal of Photovoltaics.
The Memorandum of Agreement should be signed by the time you read this. The Journal will be provided electronically to RS members.
We anticipate publishing two issues this year (2011) and four issues starting in 2012.
This is a very high visibility area and we are pleased that we can add to our stable of publications that are provided to our membership.
RS Website — We are in the process of updating our RS website. Most of the information on the website is now current and we are working toward migrating the website to a different host and (much)
better content management system that will facilitate keeping the site current. We will also be changing the website design to take advantage of some if the new IEEE-provided templates.
Hopefully this will be gradual and transparent to you, our customer! Stay tuned.
Other RS Publications — Our flagship publication, the Transactions on Reliability continues to grow in both page count and prestige. We are budgeting about 900 published pages for 2011,
up about 300 pages from just a few years ago. We could easily support even more pages, and we will continue to attempt to strategically grow the publication while maintaining quality.
The Transactions of Semiconductor Manufacturing had its five year review last fall and did quite well. The Transactions on Device and Material Reliability continues to do well. And finally,
Security and Privacy has both a new Editor in Chief (John Viega) and a new RS Assistant Editor in Chief (Robin Bloomfield). We wish them both the best in maintaining the outstanding quality of this publication.
We also welcome Shiuhpyng Shieh as our new newsletter editor, since our intrepid former editor (Christian Hansen) has moved to the position of RS Treasurer.
Shiuhpyng has already instituted an efficient way to submit articles for the newsletter and we look forward to his contributions. In a related activity,
we are creating a special PHM portion of the newsletter, edited by Pradeep Lall. The PHM portion of the newsletter will be refereed and hopefully will ultimately be a pathfinder for a new RS publication on PHM.
If you are a PHM person, please consider contributing to this activity.
Respectfully submitted
Robert Loomis, Ph.D.
VP Publications
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