Reliability Society Members,
2011 is underway. Our second AdCom meeting was held on the weekend just prior to the IRPS (The International Reliability Physics Symposium held April 10-14), of which the Reliability Society (RS) RS is a co-sponsor along with the IEEE EDS (Electron Device Society). For nearly 50 years, IRPS has been the premier conference for engineers and scientists in the area of microelectronics reliability.
The AdCom meeting went well with excellent 2011 operation / plan status presentations made by each RS officer: Alfred Stevens, VP Meetings and Conferences; Marsha Abramo, VP Membership; Robert Loomis, VP Publications; Lon Chase, VP Technical Activities; Sam Keene, Secretary; and Christian Hansen, Treasurer. Jeff Voas, RS Jr. Past President and IEEE Division VI Director, and Bill Tonti, a RS past President and IEEE Future Directions Director, briefed us on their related IEEE activities. We also had guest attendees / briefers at the meeting: Edward Cole, RS representative on the IRPS Board; Carole Graas, a Technical Activities (TA) nanotechnology expert; Prasad Chaparala, RS representative on the multi-Society Photovoltaic Journal Steering Committee; and Pravir Chandra, Cyber-Security / Hacking TA Expert. Jia Zhang, AdCom member, briefed us on the status of the upcoming RS Cloud Forum. Pradeep Lall, AdCom member, briefed us on our plan for RS webinar construction / recording. As you can tell, the AdCom meeting was very full, but all went well with all information adequately covered. Thanks to all briefers. At this AdCom meeting, five RS presidents (Loretta Arellano, Dennis Hoffman, Jeff Voas, Sam Keene, and Bill Tonti) were attending and active — reference picture.
Our RS sponsored "2011 Prognostics and System Health Management Conference" (PHM-2011 Shenzhen, May 24-25, 2011), http://www.cityu.edu.hk/phmc/PHM2011.htm, is held in China and will continue to promote the adoption and application of PHM in the Asia Pacific Rim Region.
Our RS sponsored system Prognostics and Health Management conference, "2011 IEEE International Conference on Prognostics and Health Management, Enhancing Safety, Efficiency, Availability, and Effectiveness of Systems through PHM Technology and Application" (IEEE PHM2011, June 20-23, 2011), http://www.phmconf.org/
, will spotlight all aspects of PHM (testability, diagnostics, prognostics, health management) across all its pertinent disciplines using technologies at all levels.
Our upcoming "Cloud Forum" (ICFP'11, July 7-8, 2011), http://www.ieeereliability.com/CloudForum/index.htm, is an international forum which focuses on reliability, interoperability, privacy, work-load migration, and security issues facing data migration toward Cloud Computing.
As you are well aware, the Reliability Society covers the broad aspects of reliability — everything that enhances item reliability, dependability, and availability. Thus, the RS is seen as the IEEE Specialty Engineering organization. We are covering those aspects through broad topic conferences, publications, technical activities, standards development, and training. As a RS member (or your interest in becoming a member), please let us know about your involvement interest. Our Society is great for making and maintaining excellent contacts worldwide. We also have 25 RS Chapters which provide technical meetings / activities for local involvement if you live in a Chapter area.
Several years ago, based on our broad reliability aspects, the RS became a sponsor of the Security & Privacy (S&P) magazine, which was founded by the IEEE Computer Society. Based on our sponsorship, the S&P topics were expanded to cover our interest areas. The S&P title now encompasses our aspects: "SECURITY & PRIVACY, Building Dependability, Reliability, and Trust". The RS has been providing free subscription to this magazine for our members, so you can become aware of the magazine and to attract RS authors to submit RS related papers on system reliability, system security, trust, and privacy. Please be sure to review the electronic release which you receive via email, read articles of your interest, and gain acceptance of this very excellent magazine. Robin Bloomfield is our RS Editor within the S&P Editorial Team.
I appreciate your membership. Please consider your interests and how they relate to your Society and continue to be active and involved.
Let's have a continuing positive RS 2011!
I'm pleased to bring you the May issue of Reliability Society Newsletter. This issue includes messages from the President and VPs which report recent activities in our society. The May issue features "The number one reliability driver of today's system problems," by Sam Keene, and "Operational Implications of the DNS Control Plane," by Eric Osterweil, Danny McPherson, and Lixia Zhang. You may also find society news that may be of your interests.
Reliability has become the major concern for many countries after the recent nuclear plant disaster in Japan. China Daily recently interviewed President Way Kuo of City U of Hong Kong, also an outstanding member of our society, for the impact of Japan radiation incident on Hong Kong. Another interesting news is the recent effort in promoting software reliability for education. Carnegie Mellon University’s School of Computer Science is implementing a major revision of its introductory computer science curriculum. The new courses reflect a more rigorous approach to developing reliable and secure software for parallel computing.
Thanks to Eric Wong's efforts, two very special colloquia were recently held, as part of an IEEE Reliability Society student outreach event, at the University of Texas at Dallas (UTD). The featured speakers include Dr. Jeffrey Voas from the US National Institute of Standards and Technology (NIST), also the Director of the IEEE Division VI, Professor Angelos Stavrou from George Mason University (GMU), and Dr. Sam Keene. You may find their presentation slides online. Hope you all enjoy the reading!
Newsletter has been the society's primary media for
sharing thoughts on reliability related issues and announcements of events of
interest to our members. This newsletter will publish content deemed appropriate for and of interest
to members of the IEEE Reliability Society and members of the reliability
profession in general. Accepted content includes announcements and reports of
activities sponsored by the Reliability Society including chapter meetings,
workshops and conferences. Technical
papers including reviews, opinions, case studies or new ideas for the
reliability professional are welcomed and accepted without external review.
Authors are solely responsible for the correctness of results presented and
proper citation of work by others. For submissions to Prognostic Health Management (PHM) section, please contact Dr. Pradeep Lall who is the editor handling the PHM section. For further
information please contact Dr. Lall.
Deadlines for submission of content:
Aug. 10 (Issue No. 3/2011)
Nov. 10 (Issue No. 4/2011)
Feb. 10 (Issue No. 1/2012)
May 10 (Issue No. 2/2012)
I would like to thank the RS Officers, AdCom
members, Chapter chairs and members at large who have contributed to the May issue. I sincerely hope our members can continue sharing your thoughts
through our newsletter.
If you have any suggestions or comments on the newsletter, please feel free to contact me at your convenience.
My best wishes for a joyful summer.
Shiuhpyng Shieh, PhD
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2011 IEEE Reliability Society