Queen Anne Court, University of Greenwich, Old Royal Naval College, University of Greenwich, London SE10 9LS
This is a non-profit workshop with a low registration fee of £45 to cover basic costs.

Register at https://www.regonline.com/ieeeukirelandreliabilityoutreach

The Outreach Workshop will include technical presentations by international experts on 10th June and Tutorials on 11th June. The programme is outlined below and is open to all members of IEEE, IMAPS, NMI and interested engineers and scientists.

Day 1 preliminary programme (subject to amendment):

Key International Speakers:

'Privacy & Security for Mobile Devices in Extreme Environments' Dr Jeffrey Voas, NIST, USA
‘Is a Reliable System Safe & Secure?’, Dr Ali Hessami, Director, Vega Systems, London
'New Techniques for Root-Cause Failure Analysis and Problem Solving’, Dr Suzanne Costello, MCS, Edinburgh
‘Spatial mapping of strain for materials used to integrate micro-inductors with IC technology’, Dr Andrew Bunting, Institute for Integrated Micro and Nano Systems, University of Edinburgh

‘STRaND1 - Raising the Bar in COTS Electronics’, Dr Chris Bridges, Surrey Satellites, Surrey
‘Commercial Off-The-Shelf (COTS) for Severe Environments’, Scott B. Abrams, President, The Omnicon Group Inc, USA

'The Use and Abuse of HAST for Assessment of Reliability for Severe Climates', Dr. Nihal Sinnadurai, ATTAC, UK

‘Reliability Testing Automotive Electronics’, Dr Derek Braden, Delphi– Europe

Fusion of Acoustic and X-ray Image Features for Monitoring of High Reliability electronics systems, Prof Dave Harvey, Liverpool John Moores Research Centre, UK

Day 2 Half-Day Tutorials:

'Hermeticity for Reliability' by Prof Marc Desmulliez of Heriot-Watt University.
‘Simulation for Reliability Behaviour in Severe Environments’ by Prof Chris Bailey, University of Greenwich

Co-sponsored by IMAPS-UK and NMI

ANNOUNCEMENT UK and Ireland Reliability Outreach Workshop

10-11 June 2014

ANNOUNCEMENT
UK and Ireland
Reliability Outreach Workshop