IEEE Reliability Society Newsletter     Vol. 60, No. 4. November 2014

Table of Contents

Front page:

President's Message

From the Editor

 

Society News:

Election of AdCom Members -- Awaiting Results

Announcing the Debut of the IEEE Reliability Digest

Status Update: 2014 IEEE Standards

Update of the RS Tutorial Certificate Program "Software Reliability"

 

VP Reports / Announcements

Technical VP: Status of Tech Committees and New 'Reliability Digest'

Publications VP: Call for Nominations: EIC, Transactions on Devices & Materials Reliability

 

Members & Chapters

Boston Chapter

Dallas Chapter

Outreach Guangzhou

 

Meetings & Conferences

2015 RS PHM Call for Papers

2015 RS ASTR Call for Papers

 

Letters in Reliability

Comparative Analysis: Bayesian & Classical Approaches for S/W Reliability Measurement


Links:

Reliability Society Home

RS Newsletter Homepage

VP Tech Report on the Development of Technical Committees and Reliability Digest

Shiuhpyng Winston Shieh
Vice President of Technical Activities

Dear IEEE RS members,

I’d like to take this opportunity to give you an update about the recent development in RS technical activities.  This year we made great effort in building the infrastructure for technical committees. Technical committees (TCs) are considered the core and engine of technical activities where each TC may promote the technical areas of its interest, and organize a number of affiliated conferences.  I’m pleased to share with you that six new technical committees and the working group on education were established this year.   The TCs’ webpages are now online, and more contents will be added shortly.  We are very fortunate and grateful to the new TC chairs/co-chairs/members for their contribution to the society.

Below is the list of the TC Chairs and members:.

  • Technical Committee on Internet of Things (IoT)

    Chair: Jeffrey M. Voas, National Institute of Standards and Technology
    Co–chair: Irena Bojanova: Program Director, Telecommunications Management, and Collegiate Professor, University of Maryland, University College
    Committee Member:
    George F. Hurlburt: CEO of Change Index

  • Technical Committee on Trustworthy Computing and Cybersecurity

    Chair: Wen-Guey Tzeng, National Chiao Tung University
    Committee Members:

    Raul Santelices: Assistant Professor, Department of Computer Science and Engineering, University of Notre Dame
    Brahim Hamid: Associate Professor, IRIT Research Laboratory, University of Toulouse, France

  • Technical Committee on Prognostics and Health Management (PHM)

    Chair: Rex Sallade, Sikorsky Aircraft Co.
    Co–chair: Pradeep Lall, Auburn University

  • Technical Committee on System and Software Assurance

    Chair: Eric Wong, University of Texas at Dallas

  • Technical Committee on Reliability Science for Advanced Materials & Devices

    Chair: Carole Graas, Colorado School of Mine & IBM Systems and Technology Group

  • Technical Committee on Systems of Systems

    Chair: Pierre Dersin, Alstom Transport

  • Working Group on Education

    Chair: Zhaojun (Steven) Li, Western New England University
    Committee Member:  Emmanuel Gonzalez, Jardine Schindler Elevator Corporation

  • Standards Committee

    Chair: Lou Gullo, IEEE RS Standards, Raytheon Company
    Committee Members:

    Ann Marie Neufelder: Softrel, LLC – Owner; IEEE P1633 Standard Working Group Chair

    Lance Fiondella: Assistant Professor, Dept. of Electrical and Computer Engineering, University of Massachusetts Dartmouth; IEEE P1633 Standard Working Group Vice Chair

    Steven Li: Assistant Professor, Industrial Engineering and Engineering Management, Western New England University; IEEE P61014 Standard Working Group Chair

    Diganta Das:  Research Staff at the Center for Advanced Life Cycle Engineering, University of Maryland

    Sony Mathews: Engineer at Halliburton, IEEE P1856 Standard Working Group Chair
    Mike Pecht: Chair Professor and Director of Center for Advanced Life Cycle Engineering, University of Maryland

    Arvind Sai Sarathi Vasan:  Research Assistant at Center for Advanced Life Cycle Engineering , University of Maryland; IEEE P1856 Standard Working Group Vice-Chair

    Joe Childs: Staff Reliability/Testability Engineer at Lockheed Martin

Another great story I would like to share with you is the debut of IEEE Reliability Digest (IEEE RD). IEEE RD plays the role as a vehicle to facilitate the outreach of TCs.  This new on-line magazine is published quarterly in February, May, August, and November, respectively. As an extension to the IEEE RS Newsletter, it aims to become a forum for all security and reliability aspects of science, engineering, technology and applications. The magazine covers a wide spectrum of technical areas that are related to RS technical activities. Submissions are solicited, and author guidelines can be found at http://rs.ieee.org/reliability-digest/author-guidelines.html.

The first issue on trustworthy computing and cybersecurity is expected to launch in November, 2014, the second issue on PHM is scheduled for February 2015, and the third issue on Software Assurance will be available in May 2015. Below is the agenda for the upcoming issues of Reliability Digest.

  • 1st Issue on Trustworthy Computing will be soon available on the IEEE Reliability Digest website (http://rs.ieee.org/reliability-digest/issues.html) in November, 2014
  • 2nd Issue on PHM: February, 2015
  • 3rd Issue on Software Assurance: May, 2015
  • 4th Issue on Reliability Science for Advanced Materials and Devices: August, 2015
  • 5th Issue on IoT: November, 2015
  • 6th Issue on Big data: February, 2016

The construction of multimedia resources is also underway.  Details can be found at Education Working Group website at http://rs.ieee.org/technical-committees/78-education.html.  Four educational videos have already been posted on the Working Group on Education website:

  • Sam Keene, Jeff Voas, Mike DeWalt, John Besnard, “Developing Software for Safety Critical Systems,”
  • Sam Keene, Jeff Voas, Mike DeWalt, John Besnard, “Reducing Uncertainty About Software Safety,”
  • Jeff Voas, Barry D. Preppernau, Jeffery E. Payne, Cem Kaner, “Software Testing: Building Infrastructures, Due Diligence, and OO Software - Part 1,”
  • Jeff Voas, Barry D. Preppernau, Jeffery E. Payne, Cem Kaner, “Software Testing: Building Infrastructures, Due Diligence, and OO Software - Part 2.”

Steven Li, the chair of Education Working Group, is currently leading the effort to include more tutorial videos, and short courses.  Please stay tuned.

As the technical committees continue to expand, you are all sincerely invited to be part of the technical activities.  If you have any suggestions, please feel free to email me: ssp@cs.nctu.edu.tw