Reliability Society Newsletter
Vol. 60, No. 4, November 2014
Table of Contents
VP Reports / Announcements
Members & Chapters
Meetings & Conferences
Letters in Reliability
It is fall time and the year 2014 is heading into its holiday season and rapidly is winding down. This has been a very exciting and productive year for the Reliability Society (RS) with many accomplishments that I am proud to report on. As a member of the Reliability Society, you have access to a wide variety of technical information through our conferences and publications. Personally, I have had the pleasure of attending many of our conferences this year, and I have been pleased with both attendance as well as the quality of presentations. I am grateful to the many of my colleagues who have that put in numerous hours to make sure that high quality articles are solicited and presented, and that both authors and attendees get a rewarding and enjoyable experience attending the conference. As an added value to our conference attendees, many of our conferences are offering tutorials given by experts in the field in addition to its highly technical program. This year, thanks to Professor Eric Wong and with financial assistance provided by the IEEE Future Directions Committee we are offering the opportunity to earn a Software Reliability Certificate through a selection of our conference tutorials offered on this topic, see article by Professor Wong in this edition of the newsletter.
Our society sponsored publications offer a variety of technical articles ranging from theory to practice. Our journals are highly regarded and frequently cited across a wide spectrum of authors. This year the Transactions on Reliability, our flagship journal, published its largest page count ever and is continuing to receive a record number of submissions. For our application oriented members, we are proud to offer a new product this year, Reliability Digest, a technical extension of the Reliability Society Newsletter. I commend our VP of Technical Activities Professor Shiuhpyng Shieh and his team on a very nice job putting the first special issue on trustworthy computing together. Reliability Digest helps bridge the gap between the highly technical articles published in our scholarly journals and the less technical announcements traditionally published in our newsletter.
As someone who has been an IEEE RS member for almost 25 years, I can testify to the fact that job and career advancement opportunities are highly dependent on what you know as well as who you know. Whether you are a graduating college student or a seasoned professional, IEEE RS can help you maintain or gain new knowledge, but perhaps the biggest benefit of membership is the opportunity to network with other professionals in your field. To that end, I encourage you to take full advantage of your membership by being active in an RS technical committee, or through your local chapter. Help us spread the word and promote the RS among your colleagues and especially the younger talent in your organization. In an increasingly complex and interconnected digital world, we will need to continually build and expand the talent pool for the next generation of reliability professionals and leaders in our profession.
Christian K. Hansen, PhD
From the Editor
This is the last of the RS Newsletters for 2014. It's been fun, editing this letter, because I get to see what's going on throughout the Society -- across many disciplines, across America, and across the continents! And, boy, has there been a lot going on!
The latter name I mentioned, Mike Silverman, is a recent addition to the list of those who passed this year. He was a founder of "Ops A La Carte," a reliability support supplier. He and his company were known by many of our members. Craig Hillman may have said it best:
As I mentioned before, the IEEE members continously strive to make this world a better place. We do it by assuring that engineers, managers, and customers think about their creations in ways that allow those inventions to work as well they can and last as long as they should!
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(c) 2014 IEEE Reliability Society