IEEE Reliability Society Newsletter     Vol. 61, No. 1, February 2015

Table of Contents

Front page:

President's Message

From the Editor

Society News:

RS Banquet at RAMS: Lifetime Achievement and Engineer of the Year Awards

RS Banquet at RAMS: New ExCom Slate and AdCom Electees

Members & Chapters

Boston Chapter

Dallas Chapter

Arizona Chapter

RS Chapter Outreach: China

Meetings & Conferences

Call for Abstracts: 2015 ASTR Conference, Boston, MA

Announcing 2015 IRPS, Monterrey, CA

PHM-2015 Announced: Austin, TX

Call for Papers: 2015 QRS, Vancouver, Canada

Letters in Reliability

Revisiting Perception of Reliability: Uninteroperability in US Power Grid


Reliability Society Home

RS Newsletter Homepage

Call for Paper:
The 2015 International Conference on Software Quality, Reliability and Security (QRS)

“(QRS 2015 = SERE 2015 + QSIC 2015 )

Sponsored by
IEEE Reliability Society
Vancouver, Canada
August 3-5, 2015


Starting from 2015, the SERE conference (International Conference on Software Security and Reliability; and the QSIC conference (International Conference on Quality Software; will merge into one large conference QRS, with Q representing Quality, R for Reliability, and S for Security. The conference is sponsored by the IEEE Reliability Society. This enhanced platform will better serve the scientific community as well as the industry. It draws engineers and scientists from both industry and academia to present their ongoing work, relate their research outcomes and experiences, and discuss the best and most efficient techniques for the development of reliable, secure, and trustworthy systems. This presents an excellent opportunity for the academic community to become more aware of subject areas critical to the software industry, as practitioners bring their needs to the table.


  • Reliability, security, availability, and safety of software systems
  • Software testing, verification and validation
  • Program debugging and comprehension
  • Information and software assurance
  • Fault tolerance for software reliability improvement
  • Modeling, prediction, simulation, and evaluation
  • Metrics, measurements, and analysis
  • Secure and reliable storage
  • Software penetration and protection
  • Software vulnerabilities
  • Formal methods
  • Malware detection and analysis
  • Intrusion detection and prevention
  • Operating system security and reliability
  • Mobile and smartphone applications
  • Internet of things and cloud computing
  • Information and knowledge management
  • Benchmark, tools, and empirical studies


  • January 15, 2015:        Workshop proposals due
  • March 20, 2015:          Regular papers due
  • May 1, 2015:               Fast Abstract Track due
  • April 15, 2015:            Workshop & Student Doctoral Program due
  • May 25, 2015:             Author notification
  • June 15, 2015:             Camera-ready & author registration due


Submit original manuscripts (not published or considered elsewhere) with a maximum of ten pages (regular and workshop papers), six pages (Student Doctoral Program), and two pages (Fast Abstract Track). Each paper should include a title, and the name and affiliation of each author. Except for the Fast Abstract Track, each submission should also include a 150-word abstract and up to 6 keywords. The format of your submission must follow the guidelines for IEEE conference proceedings. The first author of a Student Doctoral Program submission must be a student.

At least one Best Paper Award with a cash prize will be presented. Detailed instructions for paper submission can be found at


The proceedings will be published by IEEE Computer Society Conference Publishing Services (CPS). Accepted papers will also be submitted for inclusion into the IEEE Xplore and to other abstracting and indexing partners such as the Ei Compendex.

Authors of selected best papers from the conference will be invited to submit an extended version to a special Journal issue. During the last few years, SERE and QSIC have had special issues/sections with IEEE Transactions on Reliability, Journal of Systems and Software, Journal of Information and Technology, etc.


  • Professor W. Eric Wong, University of Texas at Dallas, USA
  • Professor T. H. Tse, The University of Hong Kong, Hong Kong


  • Professor Christian Hansen, President of the IEEE Reliability Society


  • Professor Jian Zhang, Chinese Academy of Sciences, China
  • Professor Bhavani Thuraisingham, University of Texas at Dallas, USA


For more detailed and updated information, please refer to, or contact Professor W. Eric Wong, co-Chair, Steering Committee at