Vol. 63, No. 3, November 2017

Table of Contents

Front page:


Society Announcements:


RS Events & News:


In Memory:


Articles:


Members & Chapters:

UK&Ireland Chapter Activities:
Dallas Chapter Activities:
Boston Chapter Activities:
SCV Chapter Activities:

Links:

Technical Seminar by Dr. Charles Recchia

W. Eric Wong
Editor-in-Chief
IEEE Transactions on Reliability
Chair, Dallas Chapter

Lon Chase
Member
RS Administrative Committee
Vice Chair, Dallas Chapter


The Dallas Chapter, in conjunction with the Department of Computer Science at the University of Texas at Dallas, organized a technical seminar by Dr. Charles H. Recchia on September 23, 2017.

The title of the talk was “Reliability in High-Performance Computing – Testing and Mitigation of Soft Errors.” It covered testing and design mitigation of soft errors in high performance computation, drawing on experiences from product development of large scale systems and industrial conference publications. Architectural features for soft error resilience were addressed in conjunction with accelerated testing for faults and associated errors during single event upset tolerance feature verification. The impact of cache line residency with workload on architectural vulnerability as well as single-, double- and triple-bit error detection and correction strategies were presented. The seminar also covered some aspects of the JEDEC JESD 89A standard as it pertains to accelerated testing for soft errors in semiconductor devices. System-size scaling implications and associated mitigation strategies were discussed as well as a survey of IEEE SELSE Workshop key papers and neutron-beam testing at facilities such as Los Alamos LANSCE.

Dr. Recchia has held technology development, reliability engineering and management positions at Intel Corporation, MKS Instruments, Saint-Gobain, Raytheon Integrated Defense Systems and currently M/A-COM Technology Solutions. He earned a Ph.D. in Experimental Solid State Physics from the Ohio State University, an MBA from Babson College, with visiting academic appointments at Wittenberg University and Worcester Polytechnic Institute. He is the author of 3 semiconductor technology patents, more than 20 peer-reviewed publications and has served on technical program committees for IEEE IRPS Conference and SELSE Workshops. A Senior Member of IEEE and multiple years of advisory committee service, Dr. Recchia is currently serving as Chair of the IEEE Reliability Boston Chapter and IEEE Reliability Society AdCom member.


Seminar by Dr. Charles Recchia at UT Dallas, September 23, 2017