Vol. 63, No. 3, November 2017

Table of Contents

Front page:


Society Announcements:


RS Events & News:


In Memory:


Articles:


Members & Chapters:

UK&Ireland Chapter Activities:
Dallas Chapter Activities:
Boston Chapter Activities:
SCV Chapter Activities:

Links:

Silicon Valley RS Chapter Meeting

August 2017

The SCV REL Chapter hosted their 5th technical meeting of the year on August 5th, 2017. With past topics ranging from systematic problem solving to the latest reliability status of copper pillar in semiconductor packaging, this month’s topic focused on electrostatic discharge.

The guest speaker, Michael Heaney of Amazon Lab126, captured the audience in an engaging talk regarding his current work on developing a realistic and useful ESD test for consumer electronics. Dr. Heaney provided insight on how the current ESD specification is not comprehensive enough and ways to improve it to better correlate with field usage.

Abstract: A new ESD test is being proposed for consumer electronics that is representative of field conditions and allows the prediction of field reliability. This new ESD test will be useful to consumer electronics companies. The hope is to work with other consumer electronics companies to refine this new ESD test and propose adding it to the IEC 61000-4-2 ESD spec.

If you missed the meeting, visit the IEEE SCV REL chapter website to view the presentation.