Vol. 63, No. 2, May 2017

Front page:

• President's Message

• From the Editor

Society Announcements:

• Adcom Candidates Sought

• ASTR Conference

• CFP TRel Special

• RS Mentoring Survey

Members & Chapters:

Dallas Chapter Activities:

• Dallas Seminar

• Software Contest

Boston Chapter Activities:

• Newsletter

RS Events & News:

• Jeff Voas in China

Links:

Reliability Society Home

RS Newsletter Homepage

The IEEE Reliability Society president Dr. Jeff Voas was invited to visit the University of Electronic Science and Technology of China in Chengdu from April 22 - 29, 2017. Dr. Voas was invited to give a speech on IoT/NoT as an IEEE fellow and the president of IEEE Reliability Society. His speech was well received and attracted great interests from professors and students across the whole university. During this visit, Dr. Voas also met with Professor Yuanshun Dai, who is serving as the local RS chapter chair in Chengdu, one of the newly established RS chapters in China. Dr. Voas also met with Professor Yun Lin who is working on establishing the other RS Chapter in Harbin, China.