IEEE Reliability Society Newsletter     Vol. 56, No. 3. November 2010

Table of Content

Front page:
President's Message

From the Editor

Society News:
Reliability Society Selected as a Recipient of the IEEE EAB Society / Council Professional Development Award


New Special PHM Section of the RS Newsletter

Awards: Call for Nominations

Feature Article:
You've Got Spam. Some Notes on the Reliability of E-mail Message Filtering

Chapter Activities:
Joint Boston, New Hampshire, Providence Chapter

Dallas Chapter

Teipei/Tainan Chapter

Technical Activities:
Annual Technology Report

Announcements:
IEEE Cloud Forum for Practitioners

Two Prognostic Health Management (PHM) Conferences Sponsored by the Reliability Society in 2011

IEEE SmartGrid Conference
Call for Papers


Safety & Reliability Workshop

Security and Privacy Magazine: Call for Papers

Distinguished Lecturer Program:

Call for RS
Distinguished Lecturers

Links:
Reliability Society Home


RS Newsletter Homepage

 

Overhaul of the Annual Technology Report (ATR)

 Professor W. Eric Wong at the University of Texas at Dallas, with the assistance of his students, has revamped the ATR publication process, resolving a great limitation found in the previous publications. Beginning in 2007, selected ATR articles were published in the IEEE Transactions on Reliability. This brought applied work to the attention of the transaction readership in a timely manner. The feedback received was very positive for both the timeliness and applicability of the ATR materials. However, there were a couple of drawbacks to the process. First, the ensemble of ATR articles were grouped and published as one conglomerate article in the Transactions. As a result, it is extremely difficult (if not impossible) for readers to locate a particular article online via a topical or author web search. The reference value of these papers is thus lost. Second, not all the ATR articles were published in the Transactions. The publication advantages of the annual technology report are therefore significantly compromised.

To solve this problem and to make the articles accessible by the community more quickly, we have created a new website (http://paris.utdallas.edu/IEEE-RS-ATR) for our ATR publications, including all the contributions since 2007. We have also made an important improvement by posting each article separately with a different URL so that it is findable on a search engine, and yet it is still recognized as part of the Reliability Society Annual Technical Report. Moreover, the RS banner is retained to identify the society's contribution and ownership. This series of changes significantly increases the visibility of each article. It is also critical for professional citation. We plan to continue this approach for 2010 and beyond. The second quarter issue of the RS Newsletter will report the list of articles to be published in each upcoming ATR. Our new website will be linked both in the RS Newsletter and the RS Home Page.