Vol. 65, No. 2, June 2019
Table of Contents
RS Events & News:
Members & Chapters:
Conference Highlights: The 57th IEEE International Reliability Physics Symposium
This Conference is the premier conference for engineers and scientists to present original work in the area of microelectronics and reliability. It is co-sponsored by the Reliability Society and the Electron Device Society, and this year was held in Monterey, CA, USA, March 31 – April 4, 2019. This year IRPS co-located with IEW (International ESD Workshop) and attendees were welcome to join their colleagues for keynote and invited talks.
Over 400 attendees arrived to participate in the 24 Oral Technical Sessions with 107 platform presentations which consisted of 8 invited talks and 3 Focus Sessions: Wide Band Gap Devices, Neuromorphic Computing and Electronic Design Automation Reliability Modeling. The poster session consisted of 74 IRPS posters and 14 IEW posters. Two days of Tutorials covering both introductory and advanced subjects in reliability physics preceded the symposium. On Monday evening the program included a reliability ‘Year in Review’ presentation. Tuesday evening featured 12 Workshop discussions on popular topics with food and beverages served. In addition there was an equipment exhibit during the week providing an opportunity for discussions with company representatives.
IRPS 2020 will be held March 29 – April 2, 2020 at the Hilton DFW Lakes Conference Center, Dallas, TX USA and will co-locate with IEW again. Abstract Submissions are due by October 25th, 2019.
The Call for Papers is available at https://irps.org/irps-call-for-papers/download-call-for-papers/