IEEE Reliability Society Newsletter     Vol. 56, No. 1. February 2010
Table of Content

Front page:
 President's Message
From the Editor

Society News:
Meet the RS officers and
AdCom Class of 2012

RS Members Receive Fellows Recognition

Awards:
Reliability Engineers Recognized at the Annual RS Banquet.

Distinguished Lecturer Program:
Call for RS
Distinguished Lecturers

Feature Article:
 NXT Battery Voltage Experiment

Chapter Activities:
Cleveland Chapter
Dallas Chapter
Singapore Chapter


Technical Activities:
Annual Technology Report

Announcements:
New Smart Grid Technology Initiative

Security and Privacy Magazine: Call for Papers

Links:
Reliability Society Home
RS Newsletter Homepage

 

 

 

2010 Reliability Society Annual Technology Report

Again this year, the Reliability Society will be publishing its Annual Technology Report (ATR), a compilation of a technology related articles written by more than a dozen contributors from within the reliability profession. The report will be published in its full version on the Reliability Society Website, and select articles will also appear in a special issue of the Transactions on Reliability, the Reliability Society's premier journal for peer-reviewed articles in Reliability.

This year's ATR has its primary focus on Infrastructure Reliability (generally only noticed in its absence) and will feature all of the following topics (contributors also noted).

 

Topic Author  
Some Observations about DfSS and Design for Reliabiltiy Gary Jing gary_jing@hotmail.com
Smart Grid Vision  Norm Schneidewind ieeelife@yahoo.com
Concerns Related to EMC Compliance Mark Montrose mmontros@ix.netcom.com
introducing Reliability Economics Alec Feinberg Alec.Feinberg@aei.com
A Research Agenda for Software Reliability Arbi Ghazarian    arbi@cs.toronto.edu
Power outages Jim McLinn Jmrel2@aol.com
Technology Trends Christian Hansen c.k.hansen@ieee.org
Exploratory Testing Phil Laplante plaplante@gv.psu.edu
The Business Value of IT Dave Hendrickson daveh@ieee.org
Ticking time bombs in Systems and Networks Nihal Sinnadurai  sinnadurai@aol.com
Major Bridge Collapses in the US and Around the World Jim McLinn Jmrel2@aol.com
Thermal Management Technology impact on LED reliability Markus Schwickert mschwickert@nuventix.com
VULNERABILITY ASSESSMENT OF CRITICAL INFRASTRUCTURES Enrico Zio zio@ipmce7.cesnef.polimi.it
Function Extraction Rick Linger rlinger@sei.cmu.edu
Nxt Battery voltage experiment Steve Trost steve@ssi.us
Reliability Standards Update Lou Gullo Louis_J_Gullo@raytheon.com
Role of Software in Recent Catastrophic Accidents  - in process Eric Wong ewong@utdallas.edu
Software Fault Localization Eric Wong ewong@utdallas.edu
The evolution of Fine-Grain Malware from Static To Dynamic Shiuhpyng Shieh ssp@cs.nctu.edu.tw
US Infrastructure Reliability — The Disney Monorail Catastrophe Joseph Childs jchilds14@cfl.rr.com

For more information, please contact Dr. Sam Keene (s.keene@ieee.org), VP of Technical Activities and Editor of the Annual Technology Report