IEEE Reliability Society Newsletter     Vol. 56, No. 1. February 2010

Table of Content

Front page:
President's Message
From the Editor

Society News:
Meet the RS officers and
AdCom Class of 2012

RS Members Receive Fellows Recognition

Reliability Engineers Recognized at the Annual RS Banquet.

Distinguished Lecturer Program:
Call for RS
Distinguished Lecturers

Feature Article:
NXT Battery Voltage Experiment

Chapter Activities:
Cleveland Chapter

Dallas Chapter
Singapore Chapter

Technical Activities:
Annual Technology Report

New Smart Grid Technology Initiative

Security and Privacy Magazine: Call for Papers


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2010 Reliability Society Annual Technology Report

Again this year, the Reliability Society will be publishing its Annual Technology Report (ATR), a compilation of a technology related articles written by more than a dozen contributors from within the reliability profession. The report will be published in its full version on the Reliability Society Website, and select articles will also appear in a special issue of the Transactions on Reliability, the Reliability Society's premier journal for peer-reviewed articles in Reliability.

This year's ATR has its primary focus on Infrastructure Reliability (generally only noticed in its absence) and will feature all of the following topics (contributors also noted).


Topic Author  
Some Observations about DfSS and Design for Reliabiltiy Gary Jing
Smart Grid Vision  Norm Schneidewind
Concerns Related to EMC Compliance Mark Montrose
introducing Reliability Economics Alec Feinberg
A Research Agenda for Software Reliability Arbi Ghazarian
Power outages Jim McLinn
Technology Trends Christian Hansen
Exploratory Testing Phil Laplante
The Business Value of IT Dave Hendrickson
Ticking time bombs in Systems and Networks Nihal Sinnadurai
Major Bridge Collapses in the US and Around the World Jim McLinn
Thermal Management Technology impact on LED reliability Markus Schwickert
Function Extraction Rick Linger
Nxt Battery voltage experiment Steve Trost
Reliability Standards Update Lou Gullo
Role of Software in Recent Catastrophic Accidents  - in process Eric Wong
Software Fault Localization Eric Wong
The evolution of Fine-Grain Malware from Static To Dynamic Shiuhpyng Shieh
US Infrastructure Reliability — The Disney Monorail Catastrophe Joseph Childs

For more information, please contact Dr. Sam Keene (, VP of Technical Activities and Editor of the Annual Technology Report