IEEE Reliability Society Newsletter     Vol. 61, No. 4, November 2015

Table of Contents

Front page:

President's Message

From the Editor


Society Events and Announcements:

2016 QRS Conference, Vienna, Austria - Call for Papers

2016 PHM Conference, Ottowa, Canada - Call for Papers

Announcing 2016 System of Systems Engineering (SoSE), Kongsburg, Norway

RS Tutorial in Beijing, China

2015 PHM Conference, Austin - Revisited

RS Outreach in Nanjing, China

RS Outreach in Wuhan, China


Members & Chapters:

Boston Chapter Summary

Dallas Chapter


Letters in Reliability:

More Reliable Decision Making - Sam Keene


Links:

Reliability Society Home

RS Newsletter Homepage

CALL FOR PAPERS



The IEEE Reliability Society is seeking original papers for presentation at the 7th Annual IEEE Conference on Prognostics and Health Management (PHM)

This year the Conference will be held at Carleton University in Ottawa, Canada, on June 20-22, 2016. PHM is a wide-ranging, interdisciplinary field, that requires an energized exchange of ideas. This conference will match-up world-class expertise in the academic, engineering, and management disciplines to create synergistic exchanges of ideas and practices. Special attention has been paid to assure a sociable, professional environment to encourage networking, forging new relationships, and deepening existing ones.

Authors are invited to submit papers of relevance to PHM. Example topics include but are not limited to:

◆ Energy Systems
◆ Electronics Prognostics
◆ Vehicle Health Management
◆ Powertrains
◆ Battery Prognostics
◆ Algorithms and Implementation
  ◆ Structures and Materials
◆ Economics of PHM
◆ Railway Systems
◆ Gas Turbines and Rotating Machinery
◆ Multimode Systems
◆ Aerospace Applications

Important Dates:
Extended Abstract Due
Draft Full Paper Due
Final Manuscript Due
Conference Dates
  January 8, 2016
March 2, 2016
May 2, 2016
June 20-22, 2016
For more information visit the conference website:
All presented papers that meet IEEE quality standards will be submitted to IEEE Xplore® for publication.